검색결과 : 29건
| No. | Article |
|---|---|
| 1 |
Cooling power of field emission from the n-type silicon semiconductor Chung MS, Yoon BG, Mayer A, Weis BL, Miskovsky NM, Cutler PH Journal of Vacuum Science & Technology B, 28(2), C2A19, 2010 |
| 2 |
Configuration-dependent enhancements of electric fields near the quadruple and the triple junction Chung MS, Yoon BG, Cutler PH, Miskovsky NM, Weiss BL, Mayer A Journal of Vacuum Science & Technology B, 28(2), C2A94, 2010 |
| 3 |
Theoretical analysis of the energy exchange and cooling in field emission from the conduction band of the n-type semiconductor Chung MS, Jang YJ, Mayer A, Weiss BL, Miskovsky NM, Cutler PH Journal of Vacuum Science & Technology B, 27(2), 692, 2009 |
| 4 |
Energy exchange in field emission from semiconductors Chung MS, Jang YJ, Mayer A, Cutler PH, Miskovsky NM, Weis BL Journal of Vacuum Science & Technology B, 26(2), 800, 2008 |
| 5 |
Modeling of field-assisted emission from a negative electron affinity cathode Mayer A, Chung MS, Kumar N, Weiss BL, Miskovsky NM, Cutler PH Journal of Vacuum Science & Technology B, 25(1), 109, 2007 |
| 6 |
Modeling of field-assisted emission from the image states of a glass substrate Mayer A, Chung MS, Kumar N, Weiss BL, Miskovsky NM, Cutler PH Journal of Vacuum Science & Technology B, 24(2), 629, 2006 |
| 7 |
Theoretical analysis of triple junction field emission for a type of cold cathode Chung MS, Hong SC, Cutler PH, Miskovsky NM, Weiss BL, Mayer A Journal of Vacuum Science & Technology B, 24(2), 909, 2006 |
| 8 |
Theoretical analysis of the enhanced electric field at the triple junction Chung MS, Yoon BG, Cutler PH, Miskovsky NM Journal of Vacuum Science & Technology B, 22(3), 1240, 2004 |
| 9 |
Modeling of electronic transport in GaN n-i-p junctions Mayer A, Miskovsky NM, Cutler PH Journal of Vacuum Science & Technology B, 22(6), 2574, 2004 |
| 10 |
Three-dimensional simulations of field emission through an oscillating barrier from a (10,0) carbon nanotube Mayer A, Miskovsky NM, Cutler PH Journal of Vacuum Science & Technology B, 21(1), 395, 2003 |