검색결과 : 16건
| No. | Article |
|---|---|
| 1 |
Modeling and analysis of solar photovoltaic-electrolyzer-fuel cell hybrid power system integrated with a floriculture greenhouse Ganguly A, Misra D, Ghosh S Energy and Buildings, 42(11), 2036, 2010 |
| 2 |
TiN/HfO2/SiO2/Si gate stack breakdown: Contribution of HfO2 and interfacial SiO2 layer Rahim N, Misra D Journal of the Electrochemical Society, 155(10), G194, 2008 |
| 3 |
Charge trapping at deep states in Hf-silicate based high-kappa gate dielectrics Chowdhury NA, Misra D Journal of the Electrochemical Society, 154(2), G30, 2007 |
| 4 |
Role of interfacial layer on breakdown of TiN/High-K gate stacks Chowdhury NA, Misra D, Bersuker G, Young C, Choi R Journal of the Electrochemical Society, 154(12), G298, 2007 |
| 5 |
Impact of the gate-electrode/dielectric interface on the low-frequency noise of thin gate oxide n-channel metal-oxide-semiconductor field-effect transistors Claeys C, Simoen E, Srinivasan P, Misra D Solid-State Electronics, 51(4), 627, 2007 |
| 6 |
Trapping in deep defects under substrate hot electron stress in TIN/Hf-silicate based gate stacks Chowdhury NA, Srinivasan P, Misra D Solid-State Electronics, 51(1), 102, 2007 |
| 7 |
Ge MOS capacitors with thermally evaporated HfO2 as gate dielectric Garg R, Misra D, Swain PK Journal of the Electrochemical Society, 153(2), F29, 2006 |
| 8 |
Low-frequency (1/f) noise performance of n- and p-MOSFETs with poly-Si/Hf-based gate dielectrics Srinivasan P, Simoen E, Pantisano L, Claeys C, Misra D Journal of the Electrochemical Society, 153(4), G324, 2006 |
| 9 |
Effect of nitridation on low-frequency (1/f) noise in n- and p-MOSFETS with HFO2 gate dielectrics Srinivasan P, Simoen E, Rittersma ZM, Deweerd W, Pantisano L, Claeys C, Misra D Journal of the Electrochemical Society, 153(9), G819, 2006 |
| 10 |
Montmorillonite-thermoset nanocomposites via cryo-compounding Koerner H, Misra D, Tan A, Drummy L, Mirau P, Vaia R Polymer, 47(10), 3426, 2006 |