검색결과 : 1건
No. | Article |
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1 |
Modified write-and-verify scheme for improving the endurance of multi-level cell phase-change memory using Ge-doped SbTe Zhang G, Wu Z, Jeong JH, Jeong DS, Yoo WJ, Cheong BK Solid-State Electronics, 76, 67, 2012 |
No. | Article |
---|---|
1 |
Modified write-and-verify scheme for improving the endurance of multi-level cell phase-change memory using Ge-doped SbTe Zhang G, Wu Z, Jeong JH, Jeong DS, Yoo WJ, Cheong BK Solid-State Electronics, 76, 67, 2012 |