검색결과 : 2건
| No. | Article |
|---|---|
| 1 |
Determination of well flat band condition in thin film FDSOI transistors using C-V measurement for accurate parameter extraction Mohamad B, Leroux C, Reimbold G, Ghibaudo G Solid-State Electronics, 139, 88, 2018 |
| 2 |
Reliable gate stack and substrate parameter extraction based on C-V measurements for 14 nm node FDSOI technology Mohamad B, Leroux C, Rideau D, Haond M, Reimbold G, Ghibaudo G Solid-State Electronics, 128, 10, 2017 |