화학공학소재연구정보센터
검색결과 : 11건
No. Article
1 Polarity governs atomic interaction through two-dimensional materials
Kong W, Li HS, Qiao K, Kim Y, Lee K, Nie YF, Lee D, Osadchy T, Molnar RJ, Gaskill DK, Myers-Ward RL, Daniels KM, Zhang YW, Sundram S, Yu Y, Bae SH, Rajan S, Shao-Horn Y, Cho K, Ougazzaden A, Grossman JC, Kim J
Nature Materials, 17(11), 999, 2018
2 Bulk GaN crystal growth by the high-pressure ammonothermal method
D'Evelyn MP, Hong HC, Park DS, Lu H, Kaminsky E, Melkote RR, Perlin P, Lesczynski M, Porowski S, Molnar RJ
Journal of Crystal Growth, 300(1), 11, 2007
3 Orthodox etching of HVPE-grown GaN
Weyher JL, Lazar S, Macht L, Liliental-Weber Z, Molnar RJ, Muller S, Sivel VGM, Nowak G, Grzegory I
Journal of Crystal Growth, 305(2), 384, 2007
4 Micro-Auger electron spectroscopy studies of chemical and electronic effects at GaN-sapphire interfaces
Sun XL, Bradley ST, Jessen GH, Look DC, Molnar RJ, Brillson LJ
Journal of Vacuum Science & Technology A, 22(6), 2284, 2004
5 Structure-property relationships in porous GaN generated by Pt-assisted electroless etching studied by Raman spectroscopy
Williamson TL, Diaz DJ, Bohn PW, Molnar RJ
Journal of Vacuum Science & Technology B, 22(3), 925, 2004
6 Effect of Ga-rich growth conditions on the optical properties of GaN films grown by plasma-assisted molecular beam epitaxy
Sampath AV, Garrett GA, Collins CJ, Boyd P, Choe J, Newman PG, Shen H, Wraback M, Molnar RJ, Caissie J
Journal of Vacuum Science & Technology B, 22(3), 1487, 2004
7 Low-energy electron-excited nanoluminescence studies of GaN and related materials
Brillson LJ, Bradley ST, Goss SH, Sun X, Murphy MJ, Schaff WJ, Eastman LF, Look DC, Molnar RJ, Ponce FA, Ikeo N, Sakai Y
Applied Surface Science, 190(1-4), 498, 2002
8 Morphology and luminescence of porous GaN generated via Pt-assisted electroless etching
Diaz DJ, Williamson TL, Adesida I, Bohn PW, Molnar RJ
Journal of Vacuum Science & Technology B, 20(6), 2375, 2002
9 Highly selective photoelectrochemical etching of nitride materials for defect investigation and device fabrication
Visconti P, Reshchikov MA, Jones KM, Wang DF, Cingolani R, Morkoc H, Molnar RJ, Smith DJ
Journal of Vacuum Science & Technology B, 19(4), 1328, 2001
10 Low frequency noise in n-GaN with high electron mobility
Rumyantsev SL, Look DC, Levinshtein ME, Khan MA, Simin G, Adivarahan V, Molnar RJ, Shur MS
Materials Science Forum, 338-3, 1603, 2000