검색결과 : 10건
| No. | Article |
|---|---|
| 1 |
Silver/oxygen depth profile in coins by using laser ablation, mass quadrupole spectrometer and X-rays fluorescence Cutroneo M, Torrisi L, Caridi F, Sayed R, Gentile C, Mondio G, Serafino T, Castrizio ED Applied Surface Science, 272, 25, 2013 |
| 2 |
ZnO nanostructures produced by laser ablation in water: Optical and structural properties Fazio E, Mezzasalma AM, Mondio G, Neri F, Saija R Applied Surface Science, 272, 30, 2013 |
| 3 |
Structural and optical properties of pulsed laser deposited ZnO thin films Fazio E, Patane S, Scibilia S, Mezzasalma AM, Mondio G, Neri F, Trusso S Current Applied Physics, 13(4), 710, 2013 |
| 4 |
Correlation between carbon nanotube microstructure and their catalytic efficiency towards the p-coumaric acid degradation Fazio E, Piperopoulos E, Rahim SHA, Lanza M, Faggio G, Mondio G, Neri F, Mezzasalma AM, Milone C, Santangelo S Current Applied Physics, 13(4), 748, 2013 |
| 5 |
Optical and structural properties of pulsed laser ablation deposited ZnO thin film Fazio E, Mezzasalma AM, Mondio G, Serafino T, Barreca F, Caridi F Applied Surface Science, 257(6), 2298, 2011 |
| 6 |
Electronic properties of thin films of laser-ablated Al2O3 Mezzasalma AM, Mondio G, Serafino T, Caridi F, Torrisi L Applied Surface Science, 255(7), 4123, 2009 |
| 7 |
Influence of the deposition parameters on the electronic and structural properties of pulsed laser ablation prepared Si1-xCx thin films Neri F, Barreca F, Fazio E, Barletta E, Mondio G, Trusso S, Brendebach B, Modrow H Journal of Vacuum Science & Technology A, 25(1), 117, 2007 |
| 8 |
Characterization of pulsed laser deposited a-C films by means of reflection electron energy loss spectroscopy Barreca F, Mezzasalma AM, Mondio G, Neri F, Trusso S Thin Solid Films, 398-399, 228, 2001 |
| 9 |
An investigation of the electronic and structural properties of pulsed laser-deposited a-C films Neri F, Mondio G, Mezzasalma AM, Fazio E, Trusso S, Fazio B Thin Solid Films, 398-399, 233, 2001 |
| 10 |
Optical constants of CNx thin films from reflection electron energy loss spectroscopy Barreca F, Mezzasalma AM, Mondio G, Neri F, Trusso S, Vasi C Thin Solid Films, 377-378, 631, 2000 |