검색결과 : 6건
| No. | Article |
|---|---|
| 1 |
EBSD analysis of polysilicon films formed by aluminium induced crystallization of amorphous silicon Tuzun O, Auger JM, Gordon I, Focsa A, Montgomery PC, Maurice C, Slaoui A, Beaucarne G, Poortmans J Thin Solid Films, 516(20), 6882, 2008 |
| 2 |
The metrology of a miniature FT spectrometer MOEMS device using white light scanning interference microscopy Montgomery PC, Montaner D, Manzardo O, Flury M, Herzig HP Thin Solid Films, 450(1), 79, 2004 |
| 3 |
Buried interface characterization by interference microscopy Benatmane A, Montgomery PC Thin Solid Films, 450(1), 187, 2004 |
| 4 |
Interference microscopy for nanometric surface microstructure analysis in excimer laser processing of silicon for flat panel displays Benatmane A, Montgomery PC, Fogarassy E, Zahorski D Applied Surface Science, 208, 189, 2003 |
| 5 |
Excimer laser ablation lithography applied to the fabrication of reflective diffractive optics Flury M, Benatmane A, Gerard P, Montgomery PC, Fontaine J, Engel T, Schunck JP, Fogarassy E Applied Surface Science, 208, 238, 2003 |
| 6 |
Photoetching effects in mercuric iodide Ponpon JP, Montgomery PC, Sieskind M, Amann M Applied Surface Science, 165(2-3), 233, 2000 |