화학공학소재연구정보센터
검색결과 : 17건
No. Article
1 A comprehensive study of the spontaneous formation of nanoassemblies in water by a "lock-and-key" interaction between two associative polymers
Othman M, Bouchemal K, Couvreur P, Desmaele D, Morvan E, Pouget T, Gref R
Journal of Colloid and Interface Science, 354(2), 517, 2011
2 GaAlN/GaN HEMT heterostructures grown on SiCopSiC composite substrates for HEMT application
Poisson MADF, Magis M, Tordjman M, Di Persio J, Langer R, Toth L, Pecz B, Guziewicz M, Thorpe J, Aubry R, Morvan E, Sarazin N, Gaquiere C, Meneghesso G, Hoel V, Jacquet JC, Delage S
Journal of Crystal Growth, 310(23), 5232, 2008
3 In situ epitaxial surface passivation of GaAlN/GaN HEMT heterostructures grown by LP-MOCVD
Poisson MADF, Sarazin N, Magis M, Tordjman M, Morvan E, Aubry R, di Persio J, Grimbert B
Journal of Crystal Growth, 298, 826, 2007
4 Conductance deep-level transient spectroscopy study of 1 mu m gate length 4H-SiC MESFETs
Gassoumi M, Bluet JM, Dermoul I, Maaref H, Guillot G, Morvan E, Dua C, Brylinski C
Solid-State Electronics, 50(2), 214, 2006
5 Hole-like Defects in n-Channel 4H-SIC MESFETs Observed by Current Transient Spectroscopy
Bluet JM, Gassoumi M, Dermoul I, Chekir F, Maaref H, Guillot G, Morvan E, Dua C, Brylinski C
Materials Science Forum, 483, 865, 2005
6 LP-MOCVD growth of GaAlN/GaN heterostructures on silicon carbide: application to HEMT devices
Poisson MAD, Magis M, Tordjman M, Aubry R, Sarazin N, Peschang M, Morvan E, Delage SL, di Persio J, Quere R, Grimbert B, Hoel V, Delos E, Ducatteau D, Gaquiere C
Journal of Crystal Growth, 272(1-4), 305, 2004
7 Room temperature implantation and activation kinetics of nitrogen and phosphorus in 4H-SiC crystals.
Blanque S, Perez R, Godignon P, Mestres N, Morvan E, Kerlain A, Dua C, Brylinski C, Zielinski M, Camassel J
Materials Science Forum, 457-460, 893, 2004
8 Effect of passivation on device stability and gate reverse characteristics on 4H-SiC MESFETs
Kerlain A, Morvan E, Dua C, Caillas N, Brylinski C
Materials Science Forum, 457-460, 1177, 2004
9 Deep level investigation by current and capacitance transient spectroscopy in 4H-SiC MESFETs on semi-insulating substrates.
Gassoumi M, Sghaier N, Dermoul I, Chekir F, Maaref H, Bluet JM, Guillot G, Morvan E, Noblanc O, Dua C, Brylinski C
Materials Science Forum, 457-460, 1185, 2004
10 Influence of semi-insulating substrate purity on the output characteristics of 4H-SiC MESFETs
Sghaier N, Bluet JM, Souifi A, Guillot G, Morvan E, Brylinski C
Materials Science Forum, 389-3, 1363, 2002