검색결과 : 3건
| No. | Article |
|---|---|
| 1 |
Structural analysis of 2H-WS2 thin films by X-ray and TEM investigation Ennaoui A, Diesner K, Fiechter S, Moser JH, Levy F Thin Solid Films, 311(1-2), 146, 1997 |
| 2 |
Structural, Chemical, and Electrical Characterization of Reactively Sputtered Wsx Thin-Films Regula M, Ballif C, Moser JH, Levy F Thin Solid Films, 280(1-2), 67, 1996 |
| 3 |
Single-Phase Polycrystalline Ti1-Xwxn Alloys (O-Less-Than-or-Equal-to-X-Less-Than-or-Equal-to-0.7) Grown by UHV Reactive Magnetron Sputtering - Microstructure and Physical-Properties Moser JH, Tian F, Haller O, Bergstrom DB, Petrov I, Greene JE, Wiemer C Thin Solid Films, 253(1-2), 445, 1994 |