화학공학소재연구정보센터
검색결과 : 3건
No. Article
1 A study of dynamic SIMS analysis of low-k dielectric materials
Mowat IA, Lin XF, Fister T, Kendall M, Chao G, Yang MH
Applied Surface Science, 252(19), 7182, 2006
2 Chemomechanical production of submicron edge width, functionalized, similar to 20 mu m features on silicon
Lua YY, Niederhauser TL, Wacaser BA, Mowat IA, Woolley AT, Davis RC, Fishman HA, Linford MR
Langmuir, 19(4), 985, 2003
3 Static time-of-flight secondary ion mass spectrometry of monolayers on scribed silicon derived from 1-alkenes, 1-alkynes, and 1-haloalkanes
Lua YY, Niederhauser TL, Matheson R, Bristol C, Mowat IA, Asplund MC, Linford MR
Langmuir, 18(12), 4840, 2002