검색결과 : 11건
| No. | Article |
|---|---|
| 1 |
Different stress techniques and their efficiency on triple-gate SOI n-MOSFETs Buuhler RT, Agopian PGD, Collaert N, Simoen E, Claeys C, Martino JA Solid-State Electronics, 103, 209, 2015 |
| 2 |
Analysis of temperature variation influence on the analog performance of 45 degrees rotated triple-gate nMuGFETs Pavanello MA, de Souza M, Martino JA, Simoen E, Claeys C Solid-State Electronics, 70, 39, 2012 |
| 3 |
GIDL behavior of p- and n-MuGFET devices with different TiN metal gate thickness and high-k gate dielectrics Galeti M, Rodrigues M, Martino JA, Collaert N, Simoen E, Claeys C Solid-State Electronics, 70, 44, 2012 |
| 4 |
Impact of SEG on uniaxially strained MuGFET performance Agopian PGD, Pacheco VH, Martino JA, Simoen E, Claeys C Solid-State Electronics, 59(1), 13, 2011 |
| 5 |
Influence of the sidewall crystal orientation, HfSiO nitridation and TiN metal gate thickness on n-MuGFETs under analog operation Rodrigues M, Galeti M, Martino JA, Collaert N, Simoen E, Claeys C Solid-State Electronics, 62(1), 146, 2011 |
| 6 |
Effect of rotation, gate-dielectric and SEG on the noise behavior of advanced SOI MuGFETs Put S, Mehta H, Collaert N, Van Uffelen M, Leroux P, Claeys C, Lukyanchikova N, Simoen E Solid-State Electronics, 54(2), 178, 2010 |
| 7 |
Low-frequency noise and static analysis of the impact of the TiN metal gate thicknesses on n- and p-channel MuGFETs Rodrigues M, Martino JA, Mercha A, Collaert N, Simoen E, Claeys C Solid-State Electronics, 54(12), 1592, 2010 |
| 8 |
Innovative devices for integrated circuits - A design perspective Schmitt-Landsiedel D, Werner C Solid-State Electronics, 53(4), 411, 2009 |
| 9 |
Linear kink effect Lorentzians in the noise spectra of n- and p-channel fin field-effect transistors processed in standard and strained silicon-on-insulator substrates Lukyanchikova N, Garbar N, Kudina V, Smolanka A, Claeys C, Simoen E Solid-State Electronics, 53(6), 613, 2009 |
| 10 |
Threshold voltages of SOI MuGFETs de Andrade MGC, Martino JA Solid-State Electronics, 52(12), 1877, 2008 |