검색결과 : 2건
| No. | Article |
|---|---|
| 1 |
Growth characterization of rapid thermal oxides Lai WH, Li MF, Chan L, Chua TC Journal of Vacuum Science & Technology B, 17(5), 2226, 1999 |
| 2 |
Surface and interface roughness of ultrathin nitric oxide oxynitride gate dielectric Hegde RI, Maiti B, Rai RS, Reid KG, Tobin PJ Journal of the Electrochemical Society, 145(1), L13, 1998 |