검색결과 : 1건
No. | Article |
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1 |
Effect of fabrication process on the charge trapping behavior of SiON thin films Wang SY, Lue HT, Lai EK, Yang LW, Gong J, Chen KC, Hsieh KY, Ku J, Lu CY Solid-State Electronics, 50(7-8), 1171, 2006 |
No. | Article |
---|---|
1 |
Effect of fabrication process on the charge trapping behavior of SiON thin films Wang SY, Lue HT, Lai EK, Yang LW, Gong J, Chen KC, Hsieh KY, Ku J, Lu CY Solid-State Electronics, 50(7-8), 1171, 2006 |