화학공학소재연구정보센터
검색결과 : 10건
No. Article
1 Core-shell Fe2N@amorphous carbon nanocomposite-filled 3D graphene framework: An additive-free anode material for lithium-ion batteries
Ding RR, Zhang JZ, Zhang J, Li ZH, Wang CY, Chen MM
Chemical Engineering Journal, 360, 1063, 2019
2 Enhancing the heat and load transfer efficiency by optimizing the interface of hexagonal boron nitride/elastomer nanocomposites for thermal management applications
Zhang Y, Choi JR, Park SJ
Polymer, 143, 1, 2018
3 Characteristic STATE of substrate and coatings interface formed by Impulse Plasma Deposition method
Chodun R, Nowakowska-Langier K, Zdunek K, Konarski P, Okrasa S
Thin Solid Films, 663, 25, 2018
4 Microwave conductance and electrochemical characterization of Si/a-SiNx:H heterojunctions in contact to aqueous electrolyte
Moreno EM, Friedrich D, Klein D, Kunst M
Electrochimica Acta, 98, 157, 2013
5 Interface study of AlN grown on Si substrates by radio-frequency magnetron reactive sputtering
Zhang JX, Chen YZ, Cheng H, Uddin A, Yuan S, Pita K, Andersson TG
Thin Solid Films, 471(1-2), 336, 2005
6 Joining of silicon nitride by interposing metal foils: Effects of temperature and bonding pressure
Osendi MI, Miranzo P
Materials Science Forum, 426-4, 4075, 2003
7 Interaction between an amorphous SiNx layer made by an ion-beam technique and a cerium overlayer
Ji MR, Wu JX, Ma MS, Yang HW, Zhu JS
Applied Surface Science, 174(1), 7, 2001
8 Optimization of Ultrathin Gate Oxide in a Silo/Rtn Isolation Process for Advanced ULSI - Introducing a New Concept of Surface Gettering
Deleonibus S, Martin F, Blanchard B, Ermolieff A, Papon AM
Journal of the Electrochemical Society, 141(10), 2811, 1994
9 Plasma-Deposited SiO2 for Planar Self-Aligned Gate Metal-Insulator-Semiconductor Field-Effect Transistors on Semiinsulating InP
Tabory CN, Young PG, Smith ED, Alterovitz SA
Journal of Vacuum Science & Technology B, 12(1), 130, 1994
10 In-Situ Spectroscopic Ellipsometry Studies of Interfaces of Thin-Films Deposited by PECVD
Drevillon B
Thin Solid Films, 241(1-2), 234, 1994