검색결과 : 3건
| No. | Article |
|---|---|
| 1 |
Interface states distribution in electrical stressed oxynitrided gate-oxide Belkouch S, Nguyen TK, Landsberger LM, Aktik C, Jean C, Kahrizi M Journal of the Electrochemical Society, 145(7), 2489, 1998 |
| 2 |
Electrical Characterization of Oxynitrided Gate Dielectrics Under Constant-Current Fowler-Nordheim Stress Nguyen TK, Landsberger LM, Belkouch S, Jean C Journal of the Electrochemical Society, 144(9), 3299, 1997 |
| 3 |
Studies of Electrical and Chemical-Properties of SiO2/Si After Rapid Thermal Nitridation Using Surface-Charge Spectroscopy and X-Ray Photoelectron-Spectroscopy Chan RW, Kwok RW, Lau WM, Yan H, Wong SP Journal of Vacuum Science & Technology A, 15(5), 2787, 1997 |