검색결과 : 1건
| No. | Article |
|---|---|
| 1 |
Experimental methods for investigating the defect properties of SiO2 in metal oxide semiconductor transistors Weber W, Thewes R Journal of the Electrochemical Society, 145(10), 3638, 1998 |
| No. | Article |
|---|---|
| 1 |
Experimental methods for investigating the defect properties of SiO2 in metal oxide semiconductor transistors Weber W, Thewes R Journal of the Electrochemical Society, 145(10), 3638, 1998 |