검색결과 : 4건
| No. | Article |
|---|---|
| 1 |
Determining the resolution of scanning microwave impedance microscopy using atomic-precision buried donor structures Scrymgeour DA, Baca A, Fishgrab K, Simonson RJ, Marshall M, Bussmann E, Nakakura CY, Anderson M, Misra S Applied Surface Science, 423, 1097, 2017 |
| 2 |
Product development and yield enhancement through failure analysis of integrated circuits with scanning capacitance microscopy Tangyunyong P, Nakakura CY Journal of Vacuum Science & Technology A, 21(4), 1539, 2003 |
| 3 |
Visualization of etching mechanisms of a vicinal Cu surface using scanning tunneling microscopy Nakakura CY, Altman EI Journal of Vacuum Science & Technology A, 16(3), 1566, 1998 |
| 4 |
Comparison of Bromine Etching of Polycrystalline and Single-Crystal Cu Surfaces Nakakura CY, Altman EI Journal of Vacuum Science & Technology A, 15(4), 2359, 1997 |