검색결과 : 1건
| No. | Article |
|---|---|
| 1 |
Obtaining interface state parameters by the MOS admittance technique accounting for fluctuation and tunnel effects Bormontov EN, Levin MN, Nakhmanson RS Solid-State Electronics, 44(8), 1441, 2000 |
| No. | Article |
|---|---|
| 1 |
Obtaining interface state parameters by the MOS admittance technique accounting for fluctuation and tunnel effects Bormontov EN, Levin MN, Nakhmanson RS Solid-State Electronics, 44(8), 1441, 2000 |