검색결과 : 13건
No. | Article |
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1 |
An algorithm for the in situ analysis of optical reflectance anisotropy spectra Ortega-Gallegos J, Lastras-Martinez A, Guevara-Macias LE, Garcia JGS, Ariza-Flores D, Castro-Garcia R, Lopez-Estopier RE, Balderas-Navarro RE, Lastras-Martinez LF Journal of Crystal Growth, 515, 9, 2019 |
2 |
On the origin of reflectance-anisotropy oscillations during GaAs (001) homoepitaxy Ortega-Gallegos J, Guevara-Macias LE, Ariza-Flores AD, Castro-Garcia R, Lastras-Martinez LF, Balderas-Navarro RE, Lopez-Estopier RE, Lastras-Martinez A Applied Surface Science, 439, 963, 2018 |
3 |
Real-time reflectance-difference spectroscopy during the epitaxial growth of InAs/GaAs/(001) Armenta-Franco A, Lastras-Martinez A, Ortega-Gallegos J, Ariza-Flores D, Guevara-Macias LE, Balderas-Navarro RE, Lastras-Martinez LF Applied Surface Science, 421, 608, 2017 |
4 |
Synthesis, Characterization, and Cu2+ Coordination Studies of a 3-Hydroxy-4-pyridinone Aza Scorpiand Derivative Lopez-Martinez LM, Pitarch-Jarque J, Martinez-Carnarena A, Garcia-Espana E, Tejero R, Santacruz-Ortega H, Navarro RE, Sotelo-Mundo RR, Leyva-Peralta MA, Domenech-Carbo A, Verdejo B Inorganic Chemistry, 55(15), 7564, 2016 |
5 |
Reflectance-difference spectroscopy as a probe for semiconductor epitaxial growth monitoring Lastras-Martinez A, Ortega-Gallegos J, Guevara-Macias LE, Nunez-Olvera O, Balderas-Navarro RE, Lastras-Martinez LF, Lastras-Montano LA, Lastras-Montano MA Journal of Crystal Growth, 425, 21, 2015 |
6 |
Synthesis and characterization of poly(dipropargyloxynaphtoates) containing polar Azo dyes Navarro RE, Armenta-Villegas L, Perez-Martinez AL, Beristain MF, Ogawa T Polymer Bulletin, 58(5-6), 757, 2007 |
7 |
In situ monitoring of the 2D-3D growth-mode transition in In0.3Ga0.7As/GaAs(001) by reflectance-difference spectroscopy Medel-Ruiz CI, Lastras-Martinez A, Balderas-Navarro RE, Gallardo SL, Mendez-Garcia VH, Flores-Camacho JM, Gaona-Couto A, Lastras-Martinez LF Applied Surface Science, 221(1-4), 48, 2004 |
8 |
Reflectance difference spectroscopy during CdTe/ZnTe interface formation Balderas-Navarro RE, Hingerl K, Stifter D, Bonanni A, Sitter H Applied Surface Science, 190(1-4), 307, 2002 |
9 |
On the origin of resonance features in reflectance difference data of silicon Hingerl K, Balderas-Navarro RE, Bonanni A, Tichopadek P, Schmidt WG Applied Surface Science, 175, 769, 2001 |
10 |
Influence of anisotropic in-plane strain on critical point resonances in reflectance difference data Hingerl K, Balderas-Navarro RE, Bonanni A, Stifter D Journal of Vacuum Science & Technology B, 19(4), 1650, 2001 |