검색결과 : 1건
| No. | Article |
|---|---|
| 1 |
Experimental study of the current characteristics of thin silicon oxide films under dynamic stress Zahlmann-Nowitzki JW, Nebrich L, Seegebrecht P Solid-State Electronics, 45(8), 1309, 2001 |
| No. | Article |
|---|---|
| 1 |
Experimental study of the current characteristics of thin silicon oxide films under dynamic stress Zahlmann-Nowitzki JW, Nebrich L, Seegebrecht P Solid-State Electronics, 45(8), 1309, 2001 |