검색결과 : 1건
| No. | Article |
|---|---|
| 1 |
The electrical performance and gate bias stability of an amorphous InGaZnO thin-film transistor with HfO2 high-k dielectrics Wang RZ, Wu SL, Li XY, Zhang JT Solid-State Electronics, 133, 6, 2017 |
| No. | Article |
|---|---|
| 1 |
The electrical performance and gate bias stability of an amorphous InGaZnO thin-film transistor with HfO2 high-k dielectrics Wang RZ, Wu SL, Li XY, Zhang JT Solid-State Electronics, 133, 6, 2017 |