화학공학소재연구정보센터
검색결과 : 3건
No. Article
1 Numerical modeling of RF noise in scaled MOS devices
Jungemann C, Neinhus B, Nguyen CD, Scholten AJ, Tiemeijer LF, Meinerzhagen B
Solid-State Electronics, 50(1), 10, 2006
2 Numerical simulation of strained Si/SiGe devices: the hierarchical approach
Meinerzhagen B, Jungemann C, Neinhus B, Bartels M
Applied Surface Science, 224(1-4), 235, 2004
3 Evaluation of compact noise modeling for Si/SiGe HBTs based on hierarchical hydrodynamic noise simulation
Bartels M, Neinhus B, Jungemann C, Meinerzhagen B
Applied Surface Science, 224(1-4), 350, 2004