검색결과 : 1건
| No. | Article |
|---|---|
| 1 |
Factors affecting two-dimensional dopant profiles obtained by transmission electron microscopy of etched p-n junctions in Si Neogi SS, Venables D, Na ZY, Maher DM Journal of Vacuum Science & Technology B, 16(1), 471, 1998 |
| No. | Article |
|---|---|
| 1 |
Factors affecting two-dimensional dopant profiles obtained by transmission electron microscopy of etched p-n junctions in Si Neogi SS, Venables D, Na ZY, Maher DM Journal of Vacuum Science & Technology B, 16(1), 471, 1998 |