검색결과 : 2건
| No. | Article |
|---|---|
| 1 |
Quantification of AES depth profiles by the MRI model Kovac J, Zalar A, Pracek B Applied Surface Science, 207(1-4), 128, 2003 |
| 2 |
Quantitative evaluation of sputtering induced surface roughness in depth profiling of polycrystalline multilayers using Auger electron spectroscopy Wang JY, Hofmann S, Zalar A, Mittemeijer EJ Thin Solid Films, 444(1-2), 120, 2003 |