검색결과 : 9건
| No. | Article |
|---|---|
| 1 |
Modified strain and elastic energy behavior of Ge islands formed on high-miscut Si(001) substrates Marcal LAB, Richard MI, Persichetti L, Favre-Nicolin V, Renevier H, Fanfoni M, Sgarlata A, Schulli TU, Malachias A Applied Surface Science, 466, 801, 2019 |
| 2 |
X-ray nanodiffraction in forward scattering and Bragg geometry of a single isolated Ag-Au nanowire Fernandez S, Richard MI, Floettoto D, Richter G, Mandula O, Aizarna ME, Favre-Nicolin V, Burghammer M, Schtilli T, Thomas O Thin Solid Films, 617, 9, 2016 |
| 3 |
The molecular characterization of a depurinated trial DNA sample can be a model to understand the reliability of the results in forensic genetics Fattorini P, Previdere C, Sorcaburu-Cigliero S, Marrubini G, Alu M, Barbaro AM, Carnevali E, Carracedo A, Casarino L, Consoloni L, Corato S, Domenici R, Fabbri M, Giardina E, Grignani P, Baldassarra SL, Moratti M, Nicolin V, Pelotti S, Piccinini A, Pitacco P, Plizza L, Resta N, Ricci U, Robino C, Salvaderi L, Scarnicci F, Schneider PM, Seidita G, Trizzino L, Turchi C, Turrina S, Vatta P, Vecchiotti C, Verzeletti A, De Stefano F Electrophoresis, 35(21-22), 3134, 2014 |
| 4 |
In situ coherent X-ray diffraction of isolated core-shell nanowires Haag ST, Richard MI, Favre-Nicolin V, Welzel U, Jeurgens LPH, Ravy S, Richter G, Mittemeijer EJ, Thomas O Thin Solid Films, 530, 113, 2013 |
| 5 |
Strain relaxation and critical thickness for epitaxial LaAlO3 thin films grown on SrTiO3(001) substrates by molecular beam epitaxy Merckling C, El-Kazzi M, Delhaye G, Favre-Nicolin V, Robach Y, Gendry M, Grenet G, Saint-Girons G, Hollinger G Journal of Crystal Growth, 306(1), 47, 2007 |
| 6 |
Epitaxial growth and relaxation of gamma-Al2O3 on silicon Merckling C, El-Kazzi M, Favre-Nicolin V, Gendry M, Robach Y, Grenet G, Hollinger G Thin Solid Films, 515(16), 6479, 2007 |
| 7 |
Preconditioning of dental alloys: Analysis of fibroblast proliferation and expression of fibronectin and chondroitin sulfate Sandrucci MA, Nicolin V, Casagrande L, Biasotto M, Breschi L, Di Lenarda R, Sancilio S, Grill V Journal of Materials Science, 40(23), 6233, 2005 |
| 8 |
FOX: Modular approach to crystal structure determination from powder diffraction Favre-Nicolin V, Cerny R Materials Science Forum, 443-4, 35, 2004 |
| 9 |
Resonant diffraction Hodeau JL, Favre-Nicolin V, Bos S, Renevier H, Lorenzo E, Berar JF Chemical Reviews, 101(6), 1843, 2001 |