검색결과 : 3건
| No. | Article |
|---|---|
| 1 |
High speed Bias Temperature Instability measurements on 20 nm RMG HKMG MOSFETs Chandra N, Chandrashekhar S, Francis R, Kerber A, Srinivasan P, Nigam T Solid-State Electronics, 101, 18, 2014 |
| 2 |
The vertical replacement-gate (VRG) MOSFET Hergenrother JM, Oh SH, Nigam T, Monroe D, Klemens FP, Kornblit A Solid-State Electronics, 46(7), 939, 2002 |
| 3 |
Characterization of silicon oxynitride films by grazing-emission X-ray fluorescence spectrometry Monaghan ML, Nigam T, Houssa M, De Gendt S, Urbach HP, de Bokx PK Thin Solid Films, 359(2), 197, 2000 |