검색결과 : 2건
| No. | Article |
|---|---|
| 1 |
High throughput defect detection with multiple parallel electron beams Van Himbergen HMP, Nijkerk MD, De Jager PWH, Hosman TC, Kruit P Journal of Vacuum Science & Technology B, 25(6), 2521, 2007 |
| 2 |
Influence of surface roughness on space charge limited emission Nijkerk MD, Kruit P Applied Surface Science, 233(1-4), 172, 2004 |