화학공학소재연구정보센터
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No. Article
1 Direct die-to-database electron beam inspection of fused silica imprint templates
Resnick DJ, Myron LJ, Thompson E, Hasebe T, Tokumoto T, Yan C, Yamamoto M, Wakamori H, Inoue M, Ainley E, Nordquist KJ, Dauksher WJ
Journal of Vacuum Science & Technology B, 24(6), 2979, 2006
2 Image placement issues for ITO-based step and flash imprint lithography templates
Nordquist KJ, Ainley ES, Mancini DP, Dauksher WJ, Gehoski KA, Baker J, Resnick DJ, Masnyj Z, Mangat PJS
Journal of Vacuum Science & Technology B, 22(2), 695, 2004
3 Fabrication of a surface acoustic wave-based correlator using step-and-flash imprint lithography
Cardinale GF, Skinner JL, Talin AA, Brocato RW, Palmer DW, Mancini DP, Dauksher WJ, Gehoski K, Le N, Nordquist KJ, Resnick DJ
Journal of Vacuum Science & Technology B, 22(6), 3265, 2004
4 Inspection of templates for imprint lithography
Hess HF, Pettibone D, Adler D, Bertsche K, Nordquist KJ, Mancini DP, Dauksher WJ, Resnick DJ
Journal of Vacuum Science & Technology B, 22(6), 3300, 2004
5 Repair of step and flash imprint lithography templates
Dauksher WJ, Nordquist KJ, Le NV, Gehoski KA, Mancini DP, Resnick DJ, Casoose L, Bozak R, White R, Csuy J, Lee D
Journal of Vacuum Science & Technology B, 22(6), 3306, 2004
6 Imprint lithography for integrated circuit fabrication
Resnick DJ, Dauksher WJ, Mancini D, Nordquist KJ, Bailey TC, Johnson S, Stacey N, Ekerdt JG, Willson CG, Sreenivasan SV, Schumaker N
Journal of Vacuum Science & Technology B, 21(6), 2624, 2003
7 Step and flash imprint lithography template characterization, from an etch perspective
Dauksher WJ, Mancini DP, Nordquist KJ, Resnick DJ, Standfast DL, Convey D, Wei Y
Journal of Vacuum Science & Technology B, 21(6), 2771, 2003
8 Characterization of and imprint results using indium tin oxide-based step and flash imprint lithography templates
Dauksher WJ, Nordquist KJ, Mancini DP, Resnick DJ, Baker JH, Hooper AE, Talin AA, Bailey TC, Lemonds AM, Sreenivasan SV, Ekerdt JG, Willson CG
Journal of Vacuum Science & Technology B, 20(6), 2857, 2002
9 Hydrogen silsesquioxane for direct electron-beam patterning of step and flash imprint lithography templates
Mancini DP, Gehoski KA, Ainley E, Nordquist KJ, Resnick DJ, Bailey TC, Sreenivasan SV, Ekerdt JG, Willson CG
Journal of Vacuum Science & Technology B, 20(6), 2896, 2002
10 Comparison of negative resists for 100 nm electron-beam direct write and mask making applications
Nordquist KJ, Resnick DJ, Ainley ES
Journal of Vacuum Science & Technology B, 16(6), 3289, 1998