검색결과 : 2건
| No. | Article |
|---|---|
| 1 |
Heavily tellurium doped n-type InGaAs grown by MOCVD on 300 mm Si wafers Orzali T, Vert A, Lee RTP, Norvilas A, Huang G, Herman JL, Hill RJW, Rao SSP Journal of Crystal Growth, 426, 243, 2015 |
| 2 |
Intelligent process monitoring by interfacing knowledge-based systems and multivariate statistical monitoring Norvilas A, Negiz A, DeCicco J, Cinar A Journal of Process Control, 10(4), 341, 2000 |