검색결과 : 1건
| No. | Article |
|---|---|
| 1 |
Quantification issues of trace metal contaminants on silicon wafers by means of TOF-SIMS, ICP-MS, and TXRF Rostam-Khani P, Hopstaken MJP, Vullings P, Noij G, O'Halloran O, Claassen W Applied Surface Science, 231-2, 720, 2004 |