화학공학소재연구정보센터
검색결과 : 3건
No. Article
1 Comprehensive noise performance of ultrathin oxide MOSFETs at low frequencies
Lee J, Bosman G
Solid-State Electronics, 48(1), 61, 2004
2 Defect spectroscopy using 1/f(gamma) noise of gate leakage current in ultrathin oxide MOSFETs
Lee J, Bosman G
Solid-State Electronics, 47(11), 1973, 2003
3 Ultra-Shallow-Doped Film Requirements for Future Technologies
Elkareh B
Journal of Vacuum Science & Technology B, 12(1), 172, 1994