검색결과 : 1건
| No. | Article |
|---|---|
| 1 |
Soft breakdown in very thin Ta2O5 gate dielectric layers Houssa M, Mertens PW, Heyns MM, Jeon JS, Halliyal A, Ogle B Solid-State Electronics, 44(3), 521, 2000 |
| No. | Article |
|---|---|
| 1 |
Soft breakdown in very thin Ta2O5 gate dielectric layers Houssa M, Mertens PW, Heyns MM, Jeon JS, Halliyal A, Ogle B Solid-State Electronics, 44(3), 521, 2000 |