검색결과 : 1건
| No. | Article |
|---|---|
| 1 |
Atomic-layer resolved monitoring of thermal oxidation of Si(001) by reflectance difference oscillation technique Yasuda T, Nishizawa M, Kumagai N, Yamasaki S, Oheda H, Yamabe K Thin Solid Films, 455-56, 759, 2004 |
| No. | Article |
|---|---|
| 1 |
Atomic-layer resolved monitoring of thermal oxidation of Si(001) by reflectance difference oscillation technique Yasuda T, Nishizawa M, Kumagai N, Yamasaki S, Oheda H, Yamabe K Thin Solid Films, 455-56, 759, 2004 |