| 1 |
Alternative Route Triggering Multistep Spin Crossover with Hysteresis in an Iron(II) Family Mediated by Flexible Anion Ordering
Hagiwara H, Minoura R, Udagawa T, Mibu K, Okabayashi J
Inorganic Chemistry, 59(14), 9866, 2020 |
| 2 |
Guest Molecule Inserted Spin Crossover Complexes: Fe[4-(3-Pentyl)pyridine]2[Au(CN)(2)](2)center dot Guest
Ueki Y, Okabayashi J, Kitazawa T
Chemistry Letters, 46(5), 747, 2017 |
| 3 |
Effects of Al doping and annealing on chemical states and band diagram of Y2O3/Si gate stacks studied by photoemission and x-ray absorption spectroscopy
Toyoda S, Okabayashi J, Komatsu M, Oshima M, Lee DI, Sun SY, Sun Y, Pianetta PA, Kukuruznyak D, Chikyow T
Journal of Vacuum Science & Technology A, 28(1), 16, 2010 |
| 4 |
Mn deposition on GaAs(001)-c(4 x 4)alpha reconstructed surfaces: A scanning-tunneling-microscopy study
Komamiya D, Okabayashi J, Yoshino J
Journal of Crystal Growth, 311(7), 2135, 2009 |
| 5 |
Structure transition between two GaAs(001)-c(4 x 4) surface reconstructions in AS(4) flux
Arai T, Suzuki M, Ueno Y, Okabayashi J, Yoshino J
Journal of Crystal Growth, 301, 22, 2007 |
| 6 |
Formation and properties of MnAs magnetic nanoscaled dots on sulfur-passivated semiconductor substrates
Kubo K, Kanai K, Okabayashi J, Oshima M, Ofuchi H
Journal of Crystal Growth, 301, 619, 2007 |
| 7 |
Photoemission study on interfacial reaction of Ti/n-type GaN
Naono T, Okabayashi J, Toyoda S, Fujioka H, Oshima M, Hamamatsu H
Applied Surface Science, 244(1-4), 277, 2005 |
| 8 |
Crystallization and chemical structures with annealing in ZrO2 gate insulators studied by photoemission spectroscopy and X-ray absorption spectroscopy
Okabayashi J, Toyoda S, Kumigashira H, Oshima M, Usuda K, Niwa M, Liu GL
Journal of Vacuum Science & Technology A, 23(6), 1554, 2005 |
| 9 |
Chemical states and band offsets of NH3-treated Si oxynitride films studied by high-resolution photoelectron spectroscopy
Oshima M, Toyoda S, Okabayashi J, Kumigashira H, Ono K, Niwa M, Usuda K, Hirashita N
Journal of Vacuum Science & Technology A, 22(1), 176, 2004 |
