화학공학소재연구정보센터
검색결과 : 9건
No. Article
1 Sulfur passivation for the formation of Si-terminated Al2O3/SiGe(001) interfaces
Sardashti K, Hu KT, Tang KC, Park S, Kim H, Madisetti S, McIntyre P, Oktyabrsky S, Siddiqui S, Sahu B, Yoshida N, Kachian J, Kummel A
Applied Surface Science, 366, 455, 2016
2 Characterization of interface and border traps in ALD Al2O3/GaN MOS capacitors with two-step surface pretreatments on Ga-polar GaN
Gu S, Chagarov EA, Min J, Madisetti S, Novak S, Oktyabrsky S, Kerr AJ, Kaufman-Osborn T, Kummel AC, Asbeck PM
Applied Surface Science, 317, 1022, 2014
3 All in-situ GaSb MOS structures on GaAs (001): Growth, passivation and high-k oxides
Tokranov V, Madisetti S, Yakimov M, Nagaiah P, Faleev N, Oktyabrsky S
Journal of Crystal Growth, 378, 631, 2013
4 Improvement of the GaSb/Al2O3 interface using a thin InAs surface layer
Greene A, Madisetti S, Nagaiah P, Yakimov M, Tokranov V, Moore R, Oktyabrsky S
Solid-State Electronics, 78, 56, 2012
5 AlGaAsSb superlattice buffer layer for p-channel GaSb quantum well on GaAs substrate
Tokranov V, Nagaiah P, Yakimov M, Matyi RJ, Oktyabrsky S
Journal of Crystal Growth, 323(1), 35, 2011
6 Interface properties of MBE-grown MOS structures with InGaAs/InAlAs buried channel and in-situ high-k oxide
Oktyabrsky S, Tokranov V, Koveshnikov S, Yakimov M, Kambhampati R, Bakhru H, Moore R, Tsai W
Journal of Crystal Growth, 311(7), 1950, 2009
7 Metal gate HfO2 metal-oxide-semiconductor structures on InGaAs substrate with varying Si interface passivation layer and postdeposition anneal condition
Ok I, Kim H, Zhang M, Zhu F, Park S, Yum J, Koveshnikov S, Tsai W, Tokranov V, Yakimov M, Oktyabrsky S, Lee JC
Journal of Vacuum Science & Technology B, 25(4), 1491, 2007
8 In situ monitoring of formation of InAs quantum dots and overgrowth by GaAs or AlAs
Yakimov M, Tokranov V, Agnello G, van Eisden J, Oktyabrsky S
Journal of Vacuum Science & Technology B, 23(3), 1221, 2005
9 New methods for fabricating patterned lithium niobate for photonic applications
Joshkin V, Dovidenko K, Oktyabrsky S, Saulys D, Kuech T, McCaughan L
Journal of Crystal Growth, 259(3), 273, 2003