화학공학소재연구정보센터
검색결과 : 11건
No. Article
1 Senolysis by glutaminolysis inhibition ameliorates various age-associated disorders
Johmura Y, Yamanaka T, Omori S, Wang TW, Sugiura Y, Matsumoto M, Suzuki N, Kumamoto S, Yamaguchi K, Hatakeyama S, Takami T, Yamaguchi R, Shimizu E, Ikeda K, Okahashi N, Mikawa R, Suematsu M, Arita M, Sugimoto M, Nakayama KI, Furukawa Y, Imoto S, Nakanishi M
Science, 371(6526), 265, 2021
2 Free-standing, roll-able, and transparent silicone polymer film prepared by using nanoparticles as cross-linking agents
Iijima M, Omori S, Hirano K, Kamiya H
Advanced Powder Technology, 24(3), 625, 2013
3 Binary Diffusion Coefficients of Aqueous Phenylalanine, Tyrosine Isomers, and Aminobutyric Acids at Infinitesimal Concentration and Temperatures from (293.2 to 333.2) K
Umecky T, Ehara K, Omori S, Kuga T, Yui K, Funazukuri T
Journal of Chemical and Engineering Data, 58(7), 1909, 2013
4 Enzymatic nanoreactors for environmentally benign biotransformations. 1. Formation and catalytic activity of supramolecular complexes of laccase and linear-dendritic block copolymers
Gitsov I, Hamzik J, Ryan J, Simonyan A, Nakas JP, Omori S, Krastanov A, Cohen T, Tanenbaum SW
Biomacromolecules, 9(3), 804, 2008
5 Effects of hydroxyl groups on binary diffusion coefficients of alpha-amino acids in dilute aqueous solutions
Umecky T, Omori S, Kuga T, Funazukuri T
Fluid Phase Equilibria, 264(1-2), 18, 2008
6 Liquid structure of the urea-water system studied by dielectric spectroscopy
Hayashi Y, Katsumoto Y, Omori S, Kishii N, Yasuda A
Journal of Physical Chemistry B, 111(5), 1076, 2007
7 Approach to full-chip simulation and correction of stencil mask distortion for proximity electron lithography
Sawamura J, Suzuki K, Omori S, Ashida I, Ohnuma H
Journal of Vacuum Science & Technology B, 22(6), 3092, 2004
8 Impacts of 30-nm-thick resist on improving resolution performance of low-energy electron beam lithography
Yoshizawa M, Moriya S, Oguni K, Nakano H, Omori S, Kitagawa T, Kotera M, Niu H
Journal of Vacuum Science & Technology B, 22(6), 3518, 2004
9 Complementary masking approach for proximity electron lithography
Omori S, Iwase K, Amai K, Sasaki T, Hane H, Koike K, Nohama S, Ashida I, Kitagawa T, Moriya S
Journal of Vacuum Science & Technology B, 21(1), 57, 2003
10 Photoelectron diffraction intensity calculation by using tensor low-energy electron diffraction theory
Omori S, Nihei Y
Journal of Vacuum Science & Technology A, 17(4), 1621, 1999