검색결과 : 1건
| No. | Article |
|---|---|
| 1 |
The microstructure and optical properties of p-type microcrystalline silicon thin films characterized by ex-situ spectroscopic ellipsometry Zhang H, Zhang XD, Hou GF, Wei CC, Sun J, Geng XH, Xiong SZ, Zhao Y Thin Solid Films, 521, 17, 2012 |