검색결과 : 4건
| No. | Article |
|---|---|
| 1 |
What can electron paramagnetic resonance tell us about the Si/SiO2 system? Lenahan PM, Conley JF Journal of Vacuum Science & Technology B, 16(4), 2134, 1998 |
| 2 |
Thermally induced interface degradation in (100) and (111) Si/SiO2 analyzed by electron spin resonance Stesmans A, Afanas'ev VV Journal of Vacuum Science & Technology B, 16(6), 3108, 1998 |
| 3 |
Oxide Thickness-Dependence and Bias-Dependence of Postmetallization Annealing of Interface States in Metal-Oxide-Silicon Diodes Ragnarsson LA, Lundgren P, Ovuka Z, Andersson MO Journal of the Electrochemical Society, 144(5), 1866, 1997 |
| 4 |
Optical 2nd-Harmonic Generation - A Probe of Atomic-Structure and Bonding at Si-SiO2 Interfaces, and Other Chemically-Modified Si Surfaces Emmerichs U, Meyer C, Bakker HJ, Wolter F, Kurz H, Lucovsky G, Bjorkman CE, Yasuda T, Ma Y, Jing Z, Whitten JL Journal of Vacuum Science & Technology B, 12(4), 2484, 1994 |