| 1 |
Vacuum-ultraviolet ellipsometry spectra and structural properties of Pb(Zr,Ti)O-3 films
Suchaneck G, Chvostova D, Kousal J, Zelezny V, Lynnyk A, Jastrabik L, Gerlach G, Dejneka A
Thin Solid Films, 519(9), 2885, 2011 |
| 2 |
Densification and enhanced polarisation in lead zirconate titanate sol-gel thin films
Chowdhury A, Khan MA, James C, Milne SJ
Materials Chemistry and Physics, 113(1), 135, 2009 |
| 3 |
Effect of Zr/Ti ratio on the microstructure and ferroelectric properties of lead zirconate titanate thin films
Khaenamkaew P, Muensit S, Bdikin IK, Kholkin AL
Materials Chemistry and Physics, 102(2-3), 159, 2007 |
| 4 |
C-V characteristics of Pt/PbZr0.53Ti0.47O3/LaAlO3/Si and Pt/PbZr0.53Ti0.47O3/La0.85Sr0.15CoO3/LaAlO3/Si structures for ferroelectric gate FET memory
Wang YP, Zhou L, Lu XB, Liu ZG
Applied Surface Science, 205(1-4), 176, 2003 |
| 5 |
PZT thin films with preferred-orientation induced by external stress
Qin HX, Zhu JS, Jin ZQ, Wang Y
Thin Solid Films, 379(1-2), 72, 2000 |
| 6 |
THE INFLUENCE OF CHEMICAL PASSIVATION ON THE PZT/Pt ELECTRODE INTERFACE
Jeon BS, Yoo JS
Korean Journal of Chemical Engineering, 15(1), 85, 1998 |
