검색결과 : 10건
| No. | Article |
|---|---|
| 1 |
Impact of bias conditions on electrical stress and ionizing radiation effects in Si-based TFETs Ding LL, Gnani E, Gerardin S, Bagatin M, Driussi F, Selmi L, Le Royer C, Paccagnella A Solid-State Electronics, 115, 146, 2016 |
| 2 |
Impact of proton fluence on DC and trapping characteristics in InAlN/GaN HEMTs Rossetto I, Rampazzo F, Gerardin S, Meneghini M, Bagatin M, Zanandrea A, Dua C, di Forte-Poisson MA, Aubry R, Oualli M, Delage SL, Paccagnella A, Meneghesso G, Zanoni E Solid-State Electronics, 113, 15, 2015 |
| 3 |
Coadsorption optimization of DNA in binary self-assembled monolayer on gold electrode for electrochemical detection of oligonucleotide sequences Ferrario A, Scaramuzza M, Pasqualotto E, De Toni A, Paccagnella A Journal of Electroanalytical Chemistry, 689, 57, 2013 |
| 4 |
Radiation damage on dielectrics: Single event effects Paccagnella A, Gerardin S, Cellere G Journal of Vacuum Science & Technology B, 27(1), 406, 2009 |
| 5 |
Implanted and irradiated SiO2/Si structure electrical properties at the nanoscale Porti M, Nafria N, Gerardin S, Aymerich X, Cester A, Paccagnella A, Ghidini G Journal of Vacuum Science & Technology B, 27(1), 421, 2009 |
| 6 |
Peculiar characteristics of nanocrystal memory cells programming window Gasperin A, Amat E, Martin J, Porti M, Nafria M, Paccagnella A Journal of Vacuum Science & Technology B, 27(1), 512, 2009 |
| 7 |
Stress induced leakage current under pulsed voltage stress Cester A, Paccagnella A, Ghidini G Solid-State Electronics, 46(3), 399, 2002 |
| 8 |
Soft breakdown current noise in ultra-thin gate oxides Cester A, Bandiera L, Ghidini G, Bloom I, Paccagnella A Solid-State Electronics, 46(7), 1019, 2002 |
| 9 |
Time decay of stress induced leakage current in thin gate oxides by low-field electron injection Cester A, Paccagnella A, Ghidini G Solid-State Electronics, 45(8), 1345, 2001 |
| 10 |
Aspect ratio calculation in n-channel MOSFETs with a gate-enclosed layout Giraldo A, Paccagnella A, Minzoni A Solid-State Electronics, 44(6), 981, 2000 |