검색결과 : 3건
| No. | Article |
|---|---|
| 1 |
Characterization of the interface between highly conductive Ga:ZnO films and the silicon substrate Gabas M, Ochoa-Martinez E, Navarrete-Astorga E, Landa-Canovas AR, Herrero P, Agullo-Rueda F, Palanco S, Martinez-Serrano JJ, Ramos-Barrado JR Applied Surface Science, 419, 595, 2017 |
| 2 |
Differences between GaAs/GaInP and GaAs/AlInP interfaces grown by movpe revealed by depth profiling and angle-resolved X-ray photoelectron spectroscopies Lopez-Escalante MC, Gabas M, Garcia I, Barrigon E, Rey-Stolle I, Algora C, Palanco S, Ramos-Barrado JR Applied Surface Science, 360, 477, 2016 |
| 3 |
Analysis of the surface state of epi-ready Ge wafers Gabas M, Palanco S, Bijani S, Barrigon E, Algora C, Rey-Stolle I, Garcia I, Ramos-Barrado JR Applied Surface Science, 258(20), 8166, 2012 |