검색결과 : 4건
| No. | Article |
|---|---|
| 1 |
Accurate diode behavioral model with reverse recovery Banas S, Divin J, Dobes J, Panko V Solid-State Electronics, 139, 31, 2018 |
| 2 |
Comprehensive behavioral model of dual-gate high voltage JFET and pinch resistor Banas S, Panko V, Dobes J, Hanys P, Divin J Solid-State Electronics, 123, 133, 2016 |
| 3 |
MOSFET gate dimension dependent drain and source leakage modeling by standard SPICE models Panko V, Banas S, Prejda D, Dobes J Solid-State Electronics, 81, 144, 2013 |
| 4 |
Reliable procedure for electrical characterization of MOS-based devices Dobes J, Michal J, Panko V, Pospisil L Solid-State Electronics, 54(10), 1173, 2010 |