검색결과 : 2건
| No. | Article |
|---|---|
| 1 |
Interstitial oxygen-related defects and current leakage in trench metal-oxide-semiconductor field-effect transistor on epi/As++ structure Wang Q, Daggubati M, Paravi H, Yu R, Zhang XF Journal of Vacuum Science & Technology A, 24(4), 1238, 2006 |
| 2 |
Dependence of power trench metal-oxide-semiconductor field-effect transistor processes on wafer thickness Daggubati M, Sim G, Long D, Paravi H, Wang Q Journal of Vacuum Science & Technology A, 24(4), 1289, 2006 |