검색결과 : 2건
No. | Article |
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1 |
Ultra low energy SIMS, XTEM and X-ray diffraction methods for the characterization of a MBE grown short period (SinGem)(16) superlattices Mironov OA, Fulgoni DJF, Parry CP, Cooke GA, Dowsett MG, Parker EHC, Chtcherbatchev KD, Bassas JM, Romano-Rodriguez A, Perez-Rodriguez A, Morante JR Thin Solid Films, 367(1-2), 176, 2000 |
2 |
Carbon segregation in silicon Oehme M, Bauer M, Parry CP, Eifler G, Kasper E Thin Solid Films, 380(1-2), 75, 2000 |