화학공학소재연구정보센터
검색결과 : 2건
No. Article
1 Ultra low energy SIMS, XTEM and X-ray diffraction methods for the characterization of a MBE grown short period (SinGem)(16) superlattices
Mironov OA, Fulgoni DJF, Parry CP, Cooke GA, Dowsett MG, Parker EHC, Chtcherbatchev KD, Bassas JM, Romano-Rodriguez A, Perez-Rodriguez A, Morante JR
Thin Solid Films, 367(1-2), 176, 2000
2 Carbon segregation in silicon
Oehme M, Bauer M, Parry CP, Eifler G, Kasper E
Thin Solid Films, 380(1-2), 75, 2000