검색결과 : 1건
| No. | Article |
|---|---|
| 1 |
Direct assessment of relaxation and defect propagation in different as-grown and in situ post-growth annealed thin Ge/Si and step-graded Si1-xGex/Si buffer layers Yousif MYA, Nur O, Willander M, Patel CJ, Hernandez C, Campidelli Y, Bensahel D, Kyutt RN Solid-State Electronics, 45(11), 1869, 2001 |