검색결과 : 2건
| No. | Article |
|---|---|
| 1 |
A multi-sample, multi-wavelength, multi-angle investigation of the interface layer between silicon and thermally grown silicon dioxide Herzinger CM, Johs B, McGahan WA, Paulson W Thin Solid Films, 313-314, 281, 1998 |
| 2 |
Application of IR variable angle spectroscopic ellipsometry to the determination of free carrier concentration depth profiles Tiwald TE, Thompson DW, Woollam JA, Paulson W, Hance R Thin Solid Films, 313-314, 661, 1998 |