검색결과 : 12건
No. | Article |
---|---|
1 |
An ultra-low power regulator system for WSNs powered by energy harvesting Wang C, Park M, Zhao W, Liu GN, Dilli Z, Peckerar M Solid-State Electronics, 101, 38, 2014 |
2 |
An energy harvesting system surveyed for a variety of unattended electronic applications Zhao W, Choi K, Bauman S, Salter T, Lowy DA, Peckerar M, Khandani MK Solid-State Electronics, 79, 233, 2013 |
3 |
Geometry enhanced asymmetric rectifying tunneling diodes Choi K, Ryu G, Yesilkoy F, Chryssis A, Goldsman N, Dagenais M, Peckerar M Journal of Vacuum Science & Technology B, 28(6), C6O50, 2010 |
4 |
Implementation of E-Beam Proximity Effect Correction using linear programming techniques for the fabrication of asymmetric bow-tie antennas Yesilkoy F, Choi K, Dagenais M, Peckerar M Solid-State Electronics, 54(10), 1211, 2010 |
5 |
Band gap engineered resistor for mitigating linear energy transfer sensitivities in scaled submiron CMOS technology SRAM cells Kanyogoro E, Peckerar M, Hughes H, Liu M Solid-State Electronics, 52(10), 1555, 2008 |
6 |
Electron beam and optical proximity effect reduction for nanolithography: New results Peckerar M, Sander D, Srivastava A, Foli A, Vishkin U Journal of Vacuum Science & Technology B, 25(6), 2288, 2007 |
7 |
Lithography, plasmonics, and subwavelength aperture exposure technology Ngu Y, Peckerar M, Dagenais M, Barry J, Dutt BR Journal of Vacuum Science & Technology B, 25(6), 2471, 2007 |
8 |
Papers from the 49th International Conference on Electron, Ion, and Photon Beam Technology and Nanofabrication - Preface Peckerar M Journal of Vacuum Science & Technology B, 23(6), 2577, 2005 |
9 |
Sub-0.1 mu electron-beam lithography for nanostructure development Peckerar M, Bass R, Rhee KW Journal of Vacuum Science & Technology B, 18(6), 3143, 2000 |
10 |
Fabrication and characterization of buried subchannel implant n-metal-oxide-semiconductor transistors Wang W, McCarthy D, Park D, Ma D, Marrian C, Peckerar M, Goldsman N, Melngailis J, Berry IL Journal of Vacuum Science & Technology B, 16(6), 3812, 1998 |