검색결과 : 1건
| No. | Article |
|---|---|
| 1 |
Spectroscopic ellipsometry and low-temperature reflectance : complementary analysis of GaN thin films Edwards NV, Yoo SD, Bremser MD, Horton MN, Perkins NR, Weeks TW, Liu H, Stall RA, Kuech TF, Davis RF, Aspnes DE Thin Solid Films, 313-314, 187, 1998 |