검색결과 : 2건
| No. | Article |
|---|---|
| 1 |
Hot-electron-induced electron trapping in 0.13 mu m nMOSFETs with ultrathin (EOT=1.6 nm) nitrided gate oxide Chen CW, Chien CH, Perng TH, Chang CY Electrochemical and Solid State Letters, 8(8), G187, 2005 |
| 2 |
High-density MIM capacitors with HfO2 dielectrics Perng TH, Chien CH, Chen CW, Lehnen P, Chang CY Thin Solid Films, 469-470, 345, 2004 |