검색결과 : 4건
| No. | Article |
|---|---|
| 1 |
Quantitative hydrogen measurements in PECVD and HWCVD a-Si : H using FTIR spectroscopy Goldie DM, Persheyev SK Journal of Materials Science, 41(16), 5287, 2006 |
| 2 |
Optical and electronic properties of HWCVD and PECVD silicon films irradiated using excimer and Nd : Yag lasers Shaikh MZ, O'Neill KA, Anthony S, Persheyev SK, Rose MJ Thin Solid Films, 501(1-2), 125, 2006 |
| 3 |
Laser annealed HWCVD and PECVD thin silicon films. Electron field emission O'Neill KA, Shaikh MZ, Lyttle G, Anthony S, Fan YC, Persheyev SK, Rose MJ Thin Solid Films, 501(1-2), 310, 2006 |
| 4 |
Depth profiling and the effect of oxygen and carbon on the photoelectrical properties of amorphous silicon films deposited using tungsten wire filaments Persheyev SK, Goldie DM, Gibson RAG, Rose MJ, Anthony S, Keeble DJ, Robb K, Main C, Reynolds S, Zrinscak I Thin Solid Films, 395(1-2), 130, 2001 |